AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

The chip equipment maker is working with NUS and SIT to speed process development and train engineers for automated ...

Machine learning (ML) is reshaping pipeline integrity management (PIM) from physics-based to data-driven paradigms. This ...

Advanced process control: TSMC is using the NVIDIA cuML machine learning library to accelerate large-scale analytics on NVIDIA GPUs. This lets TSMC speed algorithms and distill hundreds of thousands ...

The collaboration connects research lab optimisation with talent pipeline for industry needs. The National University of ...

Deeply's 'Listen AI Industrial' has already proven to have 99.87% accuracy in global automaker (Company H) production lines ...

Human bodies are not nearly as clear-cut as school textbooks might suggest, or as social media shows you. These rare and ...

AI is changing machine vision, but not in the way many manufacturers expect. Matt Moschner, CEO of Cognex, explains where AI ...

A material may appear flawless on the surface yet fail to function properly. The cause lies in structural defects hidden ...

Wind shear, a sudden change in wind speed or direction, is a major cause of aviation incidents; it was responsible for 18% of ...

Abstract: Spatial defect patterns on semiconductor wafer bin maps can provide valuable information on the root causes of process abnormalities. Thus, the identification of these patterns is important ...

Abstract: Grape cultivation faces various challenges, such as pests, management, fertilizer quality, and diseases caused by bacteria, fungi, and viruses. Notably, powdery mildew and blotches are ...